COT 824 - MATERIALS MICROSCOPY

(3 credits)
Introduction; principles of geometric and physical optics
Microscopy: magnification, resolution and contrast; image formation; 
aberrations
Optical microscopy: illumination; objectives and oculars; 
micrography
Advanced techniques of contrast enhancement: phase contrast, 
polarized light
Transmission electron microscopy: electron optics; image formation
Elementary contrast theory in thin foils: dislocations and stacking 
faults; Kikuchi lines
Electron diffraction
Scanning electron microscopy: electron optics, beam-sample 
interaction; image formation;  contrast mechanisms
Advanced techniques: Transmission-scanning (STEM); high voltage 
(HVTM); high resolution (HRTM); convergent beam electron 
diffraction (CBED)
The modern scanning microscopies: tunneling and atomic force (STM 
and AFM); confocal microscopy; near field optical microscopy 
(NFOSM)
Microanalysis
Microscopy on the Internet
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